Simulating atomic force microscopy imaging of the ideal and defected TiO2 „110... surface
نویسندگان
چکیده
In this study we simulate noncontact atomic force microscopy imaging of the TiO2 ~110! surface using first-principles and atomistic methods. We use three different tip models to investigate the tip-surface interaction on the ideal surface, and find that agreement with experiment is found for either a silicon tip or a tip with a net positive electrostatic potential from the apex. Both predict bright contrast over the bridging oxygen rows. We then study the interaction of this tip with a bridging oxygen vacancy on the surface, and find that the much weaker interaction observed would result in vacancies appearing as dark contrast along the bright rows in images.
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تاریخ انتشار 2003